Strain-Engineered Formation, Migration, and Electronic Properties of Polaronic Defects in CeO2
Strain-Engineered Formation, Migration, and Electronic Properties of Polaronic Defects in CeO2
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CeO2 中极化子缺陷的应变工程形成、迁移和电子特性
DOI:
10.1002/pssb.202100020
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发表时间:
2021
期刊:
影响因子:
--
通讯作者:
Zhou Miao
中科院分区:
文献类型:
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作者:
Zhang Ling;Sun Lu;Meng Qingling;Wu Jinge;Hao Xiamin;Zhai Shuwei;Dou Wenzhen;Jia Yizhen;Zhou Miao
First‐principles investigations on the strain‐engineered formation, electronic structures, and migration properties of polaronic defects in ceria (CeO2), including single polarons, oxygen vacancies (Vo2+), and polaron–vacancy complexes [(Vo2+–1polaron)1+, (Vo2+–2polaron)0], are reported. Results show that the formation energy of oxygen vacancy increases with both tensile and compressive biaxial strain, whereas the formation energies of polarons and polaron–vacancy complexes reduce (increase) with tensile (compressive) strain, so that their defect concentrations behave drastically different with strain and temperature. Interestingly, due to the distinct deformation potentials, the polaronic defect states can shift toward band edges with strain, beneficial for enhanced electrical conductivity. The migration of polarons in CeO2is further explored, and a tendency of strain‐induced directional migration is revealed. These findings not only shed light on the fundamental properties of polaronic defects in CeO2but also provide an attractive approach of combining defect engineering with strain engineering for oxide‐based functional microelectronics, batteries, and catalysts.