CrashTest'ing SWAT: Accurate, gate-level evaluation of symptom-based resiliency solutions
CrashTest'ing SWAT: Accurate, gate-level evaluation of symptom-based resiliency solutions
复制标题
CrashTesting SWAT：对基于症状的弹性解决方案进行准确的门级评估
DOI：
10.1109/date.2012.6176660
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发表时间：
2012
期刊：
影响因子：
--
通讯作者：
V. Bertacco
中科院分区：
文献类型：
--
作者：
Andrea Pellegrini;Robert Smolinski;Lei Chen;Xin Fu;S. Hari;Junhao Jiang;S. Adve;T. Austin;V. Bertacco
Current technology scaling is leading to increasingly fragile components, making hardware reliability a primary design consideration. Recently researchers have proposed low-cost reliability solutions that detect hardware faults through software-level symptom monitoring. SWAT (SoftWare Anomaly Treatment), one such solution, demonstrated with microarchitecture-level simulations that symptom-based solutions can provide high fault coverage and a low Silent Data Corruption (SDC) rate. However, more accurate evaluations are needed to validate such solutions for hardware faults in real-world processor designs. In this paper, we evaluate SWAT's symptom-based detectors on gate-level faults using an FPGA-based, full-system prototype. With this platform, we performed a gate-level accurate fault injection campaign of 51,630 fault injections in the OpenSPARC T1 core logic across five SPECInt 2000 benchmarks. With an overall SDC rate of 0.79%, our results are comparable to previous microarchitecture-level evaluations of SWAT, demonstrating the effectiveness of symptom-based software detectors for permanent faults in real-world designs.
