Theoretical Description of the High-Frequency Magnetic Force Microscopy Technique
Theoretical Description of the High-Frequency Magnetic Force Microscopy Technique
复制标题
高频磁力显微镜技术的理论描述
DOI：
10.1109/tmag.2009.2021985
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发表时间：
2009
影响因子：
2.1
通讯作者：
U. Hartmann
中科院分区：
文献类型：
--
作者：
M. Koblischka;U. Hartmann
我们提出了高频磁力显微镜（HF-MFM）技术的理论描述。目前有两种操作模式：1）通过其磁杂散场测量高频电流，以及2）测量硬盘写入器极发出的杂散场。先进的HF-MFM技术采用幅度调制技术，以便将HF信号转换到悬臂梁的频率范围。使用点偶极近似，我们计算了这两种情况下的悬臂梁上的合力。
We present a theoretical description of the high-frequency magnetic force microscopy (HF-MFM) technique. There are currently two operation modes: 1) the measurement of high-frequency currents via their magnetic stray fields and 2) the measurement of stray fields emanating from hard disk writer poles. The advanced HF-MFM technique employs the amplitude-modulation technique in order to convert the HF signal to the frequency range of the cantilever. Using the point-dipole approximation, we calculate the resulting force onto the cantilever for both cases.