Dynamic coercivity measurements in thin film recording media using a contact write/read tester
Dynamic coercivity measurements in thin film recording media using a contact write/read tester
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使用接触式写/读测试仪测量薄膜记录介质的动态矫顽力
DOI：
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发表时间：
1999
期刊：
影响因子：
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通讯作者：
M. Doerner
中科院分区：
文献类型：
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作者：
A. Moser;D. Weller;M. Best;M. Doerner
热激活的磁化反转过程变得明显，在此期间，施加与初始磁化方向相反的磁场的时间上的反射率的依赖性。它们对未来高密度记录介质的长期稳定性和短时间可写性具有重要影响。在本文中，我们报告了一项使用接触式写入/读取测试仪的新实验，以研究剩余矫顽磁力在超过10个数量级（从6 ns到>60 s）的时间依赖性。测量了厚度为5.5nm的CoPtCr记录介质的剩磁和信号衰减。
Thermally activated magnetization reversal processes become manifest in the dependence of the remanent coercivity on the time during which a magnetic field is applied opposite to the initial magnetization direction. They have important consequences for the long term stability and short time writeability of future high density recording media. In this paper, we report on a new experiment using a contact write/read tester to study the time dependence of the remanent coercivity over more than 10 orders of magnitude (from 6 ns to >60 s). Remanence coercivity and signal decay measurements of a CoPtCr recording medium with 5.5 nm thickness are presented.