Super-resolution plasmonic imaging microscopy for a submicron tracking emulsion detector
Super-resolution plasmonic imaging microscopy for a submicron tracking emulsion detector
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DOI：
10.1093/ptep/ptz033
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发表时间：
2019-06-01
影响因子：
3.5
通讯作者：
Yoshimoto, Masahiro
中科院分区：
文献类型：
--
作者：
Umemoto, Atsuhiro;Naka, Tatsuhiro;Yoshimoto, Masahiro
纳米成像跟踪器（NIT）是一种超细颗粒核乳剂，能够以纳米分辨率检测电离粒子，并通过各种形状和尺寸的银纳米颗粒线记录轨迹。粒子轨迹需要通过一些显微技术来读出；在这里，我们重点研究银纳米颗粒的光学响应，以实现超越衍射极限的读出方法。在本文中，开发了超分辨率等离子体成像显微镜（SRPIM），它利用局域表面等离子体共振（LSPR）产生的偏振相关光学响应。 SRPIM 的空间分辨率为 4.7 +/- 0.1 nm，可识别纳米颗粒位置。我们表明，SRPIM 可以清楚地区分平均范围为 270 nm 的 100 keV 碳离子轨迹与直径为 60 nm 的单个纳米颗粒。 100 keV碳轨道的识别效率为49 +/- 4%，角度分辨率为17 +/- 2度。
A Nano Imaging Tracker (NIT) is a super-fine-grained nuclear emulsion that is capable of detecting an ionizing particle with nanometric resolution and recording the track by a line of silver nanograins of various shapes and sizes. The particle tracks need to be read out by some microscopic techniques; here we focus on the optical response of silver nanograins to realize a readout method beyond the diffraction limit. In this paper, super-resolution plasmonic imaging microscopy (SRPIM), which utilizes the polarization-dependent optical response due to the localized surface plasmon resonance (LSPR) is developed. A spatial resolution of 4.7 +/- 0.1 nm for SRPIM to identify the nanograin position is achieved. We show that SRPIM clearly discriminates 100 keV carbon ion tracks with a mean range of 270 nm from single nanograins with a diameter of 60 nm. The recognition efficiency of the 100 keV carbon track was 49 +/- 4% and the angular resolution was 17 +/- 2 degrees.