A passive long-wavelength infrared microscope with a highly sensitive phototransistor.
A passive long-wavelength infrared microscope with a highly sensitive phototransistor.
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DOI：
10.1063/1.3152224
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发表时间：
2009-06
期刊：
影响因子：
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通讯作者：
Y. Kajihara;S. Komiyama;P. Nickels;T. Ueda
中科院分区：
文献类型：
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作者：
Y. Kajihara;S. Komiyama;P. Nickels;T. Ueda
利用一种称为电荷敏感红外光电晶体管（CSIP）的超高灵敏度探测器，研制了一种长波红外（LWIR）区域被动扫描共聚焦显微镜，用于对自发LWIR辐射进行灵敏成像。显微镜由室温组件（包括Ge物镜）和液氦温度组件（包括共焦针孔、Ge继电器透镜和CSIP探测器）组成。利用显微镜对物体自发发射的热辐射（波长为14.7微米）进行了研究，空间分辨率为25微米。通过扫描由玻璃、铝箔、银浆和金组成的样品，获得了清晰的被动LWIR成像图像。即使样品表面覆盖GaAs或Si板，也能获得清晰的被动LWIR图像。这项工作表明CSIP探测器在被动LWIR显微镜中的应用是有用的。
A passive scanning confocal microscope in the long-wavelength infrared (LWIR) region has been developed for sensitive imaging of spontaneous LWIR radiation by utilizing an ultrahighly sensitive detector, called the charge-sensitive infrared phototransistor (CSIP). The microscope consisted of room-temperature components including a Ge objective lens and liquid helium temperature components including a confocal pinhole, Ge relay lenses, and CSIP detector. With the microscope, thermal radiation (wavelength of 14.7 microm) spontaneously emitted by the object was studied with a spatial resolution of 25 microm. Clear passive LWIR imaging pictures were obtained by scanning a sample consisting of glass, Al foil, Ag paste, and Au. Clear passive LWIR image was also obtained even when the sample surface was covered by a GaAs or Si plate. This work suggests usefulness of CSIP detectors for application of passive LWIR microscopy.