An analytical study of the pulsed thermography defect detection limit
An analytical study of the pulsed thermography defect detection limit
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DOI：
10.1063/1.4704684
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发表时间：
2012-05-01
影响因子：
3.2
通讯作者：
Pickering, S. G.
中科院分区：
文献类型：
--
作者：
Almond, D. P.;Pickering, S. G.
一个简单的修改层的热对比度的一维表达式提供了一个有用的预测的峰值对比度温度和对比度峰值时间的所有纵横比的缺陷。新的分析结果已被证明是同意与数值模拟。热成像无损评价（NDE）的经验法则，检测到的缺陷，如果纵横比超过两个被证明是没有普遍的有效性，峰值对比度被发现严重依赖于缺陷的深度和吸收的激发能量，以及缺陷的纵横比。热扩散率各向异性的影响包括在分析中，并通过模拟复合材料中的缺陷图像对比度来说明。(C)2012年美国物理学会。[http：//dx.doi.org/10.1063/1.4704684]
A simple modification of the one-dimensional expression for the thermal contrast of a layer provides a useful prediction of peak contrast temperature and contrast peak time for defects of all aspect ratios. The new analytical results have been shown to agree with numerical modelling. The thermographic nondestructive evaluation (NDE) rule-of-thumb that defects are detected if aspect ratio exceeds two is shown to have no general validity as peak contrast is found to depend critically on defect depth and absorbed excitation energy as well as defect aspect ratio. The effects of thermal diffusivity anisotropy are included in the analysis and illustrated by simulations of defect image contrast in composite materials. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4704684]