Polarization coupling in epitaxial ZnO / BaTiO3 thin film heterostructures on SrTiO3 (100) substrates
Polarization coupling in epitaxial ZnO / BaTiO3 thin film heterostructures on SrTiO3 (100) substrates
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DOI：
10.1117/12.715217
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发表时间：
2007-02
期刊：
影响因子：
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通讯作者：
M. Lorenz;M. Brandt;J. Schubert;H. Hochmuth;H. von Wenckstern;M. Schubert;M. Grundmann
中科院分区：
文献类型：
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作者：
M. Lorenz;M. Brandt;J. Schubert;H. Hochmuth;H. von Wenckstern;M. Schubert;M. Grundmann
通过将具有可切换极化的铁电材料与表现出永久自发极化的纤锌矿层相结合，预期强极化耦合。为了证明这些电荷耦合效应，电流-电压，电导率-频率和电容-频率（导纳）特性已被测量的外延异质结构上生长的铁电BaTiO 3（001）薄膜上的SrRuO 3（100）衬底上的氧化物SrRuOx，金属Pt和半导体ZnO顶部电极的导电SrRuO 3层。电测量结果表明，铁电钙钛矿BaTiO 3和压电纤锌矿ZnO薄膜的极化耦合的明确迹象。
Strong polarization coupling is expected by combining ferroelectric materials with switchable polarization and wurtzite layers exhibiting a permanent spontaneous polarization. To demonstrate these charge coupling effects, current-voltage, conductivity-frequency and capacitance-frequency (admittance) characteristics have been measured on epitaxial heterostructures grown of ferroelectric BaTiO3 (001) films on conducting SrRuO3 layers on SrTiO3 (100) substrates with oxide SrRuOx, metallic Pt and semiconducting ZnO top electrodes. The electrical measurements show clear indications for polarization coupling of the ferroelectric perovskite BaTiO3 and the piezoelectric wurtzite ZnO thin films.