Sub-picowatt/kelvin resistive thermometry for probing nanoscale thermal transport.
Sub-picowatt/kelvin resistive thermometry for probing nanoscale thermal transport.
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DOI:
10.1063/1.4826493
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发表时间:
2013-11
期刊:
影响因子:
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通讯作者:
Jianlin Zheng;M. Wingert;Edward Dechaumphai;Renkun Chen
中科院分区:
文献类型:
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作者:
Jianlin Zheng;M. Wingert;Edward Dechaumphai;Renkun Chen
Advanced instrumentation in thermometry holds the key for experimentally probing fundamental heat transfer physics. However, instrumentation with simultaneously high thermometry resolution and low parasitic heat conduction is still not available today. Here we report a resistive thermometry scheme with ~50 μK temperature resolution and ~0.25 pW/K thermal conductance resolution, which is achieved through schemes using both modulated heating and common mode noise rejection. The suspended devices used herein have been specifically designed to possess short thermal time constants and minimal attenuation effects associated with the modulated heating current. Furthermore, we have systematically characterized the parasitic background heat conductance, which is shown to be significantly reduced using the new device design and can be effectively eliminated using a "canceling" scheme. Our results pave the way for probing fundamental nanoscale thermal transport processes using a general scheme based on resistive thermometry.