Active Chiral Plasmonics: Flexoelectric Control of Nanoscale Chirality
Active Chiral Plasmonics: Flexoelectric Control of Nanoscale Chirality
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DOI：
10.1002/adpr.202000062
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发表时间：
2020-10
期刊：
影响因子：
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通讯作者：
C. Gilroy;Katie McKay;Machar Devine;R. W. Webster;N. Gadegaard;A. Karimullah;D. Maclaren;M. Kadodwala
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文献类型：
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作者：
C. Gilroy;Katie McKay;Machar Devine;R. W. Webster;N. Gadegaard;A. Karimullah;D. Maclaren;M. Kadodwala
通过计算斯托克斯偏振参数（偏振场的可观测量）来确定ORD。通过计算反射回纳米结构阵列上方的表面上的入射功率的比率来确定反射率。使用电场和电流模块进行电场模拟。在器件的金和铂层之间施加等于阈值电压的电势。随后在平分手里剑纳米结构的平面上计算电场和电场梯度（参见支持信息）。电压依赖性测量：将0 - 12 V范围内的较大DC电压依次施加至器械，持续至少1 h。Au层和Pt层分别是正电极和负电极。收集反射率和ORD数据以监测由施加电压引起的光学特性的变化。如果在此期间内没有观察到光谱的变化，则增加电压。但是，如果观察到变化，则将器械保持在该电压下足够长的时间，以使光谱稳定且不会发生进一步变化。在这一点之后，将装置保持在0 V，并收集光谱以监测任何向装置的初始光学状态的弛豫，持续长达3小时的时间。然后在15小时后重复该循环（cid：4）。
ORD was determined by calculation of the Stokes polarization parameters, the observables of the polarized fi eld. Re fl ectance was determined by cal-culating the ratio of incident power re fl ected back onto a surface above the nanostructure array. Electric fi eld simulations were carried out using the Electric Fields and Currents module. An electric potential equal to the threshold voltage was applied between the gold and platinum layers of the device. Electric fi eld and electric fi eld gradients were subsequently calculated at planes which bisected the shuriken nanostructure (see Supporting Information). Voltage-Dependent Measurements : Sequentially larger DC voltages in the range 0 – 12V were applied to the devices for a period of at least 1h. The Au and Pt layers were the positive and negative electrodes, respectively. Both re fl ectance and ORD data were collected to monitor change in optical prop- erties induced by the applied voltage. If no change in optical spectra was observed within this period, the voltage was increased. However, if changes were observed then the device was maintained at the voltage for a time period suf fi cient for spectra to stabilize and no further changes to occur. After this point, the device was maintained at 0V and spectra collected to monitor any relaxation back toward the initial optical state of the device for periods of up to 3h. This cycle was then repeated (cid:4) 15h later.