Thickness estimation of interface films formed on Li1−xCoO2 electrodes by hard X-ray photoelectron spectroscopy
Thickness estimation of interface films formed on Li1−xCoO2 electrodes by hard X-ray photoelectron spectroscopy
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利用硬 X 射线光电子能谱估计 Li1−xCoO2 电极上形成的界面膜的厚度
DOI：
10.1016/j.jpowsour.2011.08.097
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发表时间：
2011
影响因子：
9.2
通讯作者：
Z. Ogumi
中科院分区：
文献类型：
--
作者：
Y. Takanashi;Y. Orikasa;M. Mogi;Masatsugu Oishi;H. Murayama;Kenji Sato;H. Yamashige;D. Takamatsu;Takahiro Fujimoto;H. Tanida;H. Arai;T. Ohta;E. Matsubara;Y. Uchimoto;Z. Ogumi
用硬X射线光电子能谱（HX-PES）观察了在Li 1 − xCoO 2电极上形成的固体电解质界面（SEI）膜。本文特别着重于膜厚估算与理论计算使用HX-PES。利用模型SEI膜进行的实验验证了计算的正确性。在LiCoO 2复合电极上形成的膜为LiF，膜厚约为5 nm。还表明在LiCoO 2顶部形成Co（II）物种。在60°C下储存电极引起相当大的膜生长（30- 40 nm），并形成碳酸盐化合物。在充电过程中的LiCoO 2电极的SEI膜的变化也进行了检查。薄膜的主要成分是LiF或一种萤石，其厚度在充电过程中逐渐减小。还阐明了SEI的形成机制。
Solid electrolyte interface (SEI) films formed on Li1−xCoO2electrodes were observed with hard X-ray photoelectron spectroscopy (HX-PES). This paper particularly focuses on film thickness estimation using HX-PES with theoretical calculation. The validity of the calculation was proven by experiments using model SEI films. The native film formed on a LiCoO2composite electrode was estimated to be LiF with its thickness of 5nm. Formation of Co (II) species on top of LiCoO2was also indicated. Storage of the electrode at 60°C brought about considerable film growth (30–40nm) with carbonate compounds formation. SEI film changes during charging of the LiCoO2electrode were also examined. The main component in the film was deduced to be LiF or a kind of fluorite, with its thickness decreased during charging. The SEI formation mechanisms are also elucidated.