Random Telegraph Signal in CMOS Image Sensor Pixels

Random Telegraph Signal in CMOS Image Sensor Pixels
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DOI:
10.1109/iedm.2006.346973
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发表时间:
2006-12
期刊:
2006 International Electron Devices Meeting
影响因子:
--
通讯作者:
Xinyang Wang;P. R. Rao;A. Mierop;Cynthia Yin
Xinyang Wang;P. R. Rao;A. Mierop;Cynthia Yin
中科院分区:
其他
文献类型:
--
作者:
Xinyang Wang;P. R. Rao;A. Mierop;Cynthia Yin

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在这项工作中,表征了钉扎光电二极管 CMOS 像素中源极跟随器 (SF) 的 1/f 噪声。研究发现,这些像素中的 1/f 噪声实际上是由于数量非常有限的陷阱造成的,并导致随机电报信号 (RTS)。指出了相关双采样 (CDS) 对该 RTS 的反应。成像仪读取噪声的温度依赖性揭示了 CDS 期间 RTS 的两种机制
In this work, the 1/f noise of the source follower (SF) in pinned-photodiode CMOS pixels is characterized. It is found that the 1/f noise in these pixels is actually due to a very limited number of traps and results in a random telegraph signal (RTS). It is pointed out how the correlated-double sampling (CDS) reacts on this RTS. The temperature dependency of the imager read noise revealed two mechanisms of RTS during CDS