Raman Spectra and Magnetic Property Analysis of Nd-Doped ZnO Thin Films
Raman Spectra and Magnetic Property Analysis of Nd-Doped ZnO Thin Films
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DOI：
10.7567/jjap.52.01ac14
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发表时间：
2013
影响因子：
1.5
通讯作者：
M. Subramanian;K. Senthilkumar;M. Tanemura;T. Soga;T. Hihara
中科院分区：
文献类型：
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作者：
M. Subramanian;K. Senthilkumar;M. Tanemura;T. Soga;T. Hihara
本研究是一项详细研究，旨在了解良好表征的 Nd 掺杂 ZnO 薄膜的铁磁性起源。拉曼散射显示 Zn1-xNdxO（x = 0、0.05、0.10 和 0.15）的 E2high 声子线不对称地展宽并移至较低频率，表明 Nd3+ 取代引起的微观结构紊乱。 Zn1-xNdxO 薄膜表现出室温铁磁性，居里温度高于 350 K。此外，当在垂直于样品表面的方向施加磁场时，薄膜表现出磁各向异性，磁化强度在 3 kOe 内高于在面内方向施加磁场。
The present investigation is a detailed study aiming to understand the origin of the ferromagnetism of the well-characterized Nd-doped ZnO films. Raman scattering shows that the E2high phonon line of Zn1-xNdxO (x = 0, 0.05, 0.10, and 0.15) is broadened asymmetrically and shifts to a lower frequency, suggesting microscopic structural disorder induced by Nd3+ substitutions. Zn1-xNdxO films exhibit room-temperature ferromagnetism with a Curie temperature higher than 350 K. In addition, the films revealed magnetic anisotropy with higher magnetization in 3 kOe when the field was applied in the perpendicular direction to the sample surface than when applied in an in-plane direction.