Optical Multi-Context Blind Scrubbing for Field Programmable Gate Arrays
Optical Multi-Context Blind Scrubbing for Field Programmable Gate Arrays
复制标题
用于现场可编程门阵列的光学多上下文盲擦洗
DOI：
10.1109/jphot.2020.3038900
复制
发表时间：
2020
影响因子：
2.4
通讯作者：
Minoru Watanabe
中科院分区：
文献类型：
--
作者：
Yusuke Takaki;Minoru Watanabe
提出了一种新的光学多上下文盲洗算法，不仅可以提高现场可编程门阵列(FGA)配置存储器的软错误容错性，而且可以支持高速动态重构，适合加速现场可编程门阵列(FGA)运算。光学多上下文盲洗操作使用全息存储器作为无软错误抗辐射加固的外部存储器。它利用了它的二维大带宽光纤总线。通过四种配置上下文演示了光多上下文盲洗操作。通过使用两个4-MBq Am-241α粒子源的辐射耐受性实验，评估了擦洗操作的软错误容限。结果表明，洗涤操作的最坏情况下平均修复时间为560 ns，可以在强辐射空间环境下实现足够的软错误容错。
This paper presents aproposal of a new optical multi-context blind scrubbing that can not only increase the soft-error tolerance of the configuration memory of field programmable gate arrays (FPGAs) but also support high-speed dynamic reconfiguration suitable for accelerating FPGA operations. The optical multi-context blind scrubbing operation uses a holographic memory as a soft-error free radiation-hardened external memory. It exploits its two-dimensional large-bandwidth optical bus. Optical multi-context blind scrubbing operation was demonstrated with four configuration contexts. The soft-error tolerance of the scrubbing operation was evaluated using a radiation tolerance experiment using two 4-MBq Americium-241 alpha particle sources. Results show the worst case mean time to repair (MTTR) of the scrubbing operation as 560 ns, which can realize sufficient soft-error tolerance in radiation-rich space environments.