Characterization of Modules and Arrays with Suns Voc
Characterization of Modules and Arrays with Suns Voc
复制标题
使用 Suns Voc 表征模块和阵列
DOI：
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发表时间：
2017
期刊：
影响因子：
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通讯作者：
S. Bowden
中科院分区：
文献类型：
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作者：
Alex Killam;S. Bowden
Suns-VOC目前用作电池级测试的表征技术。Suns-VOC的想法可以应用于使用自然光的模块和阵列，以表征性能，退化和诊断故障。建模模拟显示作为证据，太阳VOC可以应用作为一种表征技术。实验结果开始显示该技术如何应用于现场应用。表征技术已经证明，可以进行更深入的分析，以提供一个负担得起的表征技术的模块和阵列的证据。
Suns-VOC is currently used as a characterization technique for cell level testing. The idea of Suns-VOC can be applied using natural light to modules and arrays to characterize the performance, degradation, and diagnose failures. Modeling simulations are show as evidence that Suns-VOC can be applied as a characterization technique. Experimental results begin to show how the technique is applied in field application. The characterization technique has proven evidence that more in depth analysis can be performed to provide as an affordable characterization technique for modules and arrays.