Influence of grain boundary scattering on the electrical properties of platinum nanofilms
Influence of grain boundary scattering on the electrical properties of platinum nanofilms
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DOI：
10.1063/1.2338885
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发表时间：
2006-09
影响因子：
4
通讯作者：
Q. Zhang;Xing Zhang;B. Cao;M. Fujii;Koji Takahashi;T. Ikuta
中科院分区：
文献类型：
--
作者：
Q. Zhang;Xing Zhang;B. Cao;M. Fujii;Koji Takahashi;T. Ikuta
对多晶铂纳米薄膜的电导率和电阻温度系数进行了实验和理论研究。结果表明，这些电性能已大大降低，主要是由晶界散射。通过应用Mayadas及其同事的理论[Appl. Phys. Lett. 14，345（1969）; Phys. Rev. B 1，1382（1970）]预测具有相同反射系数的电阻的电导率和温度系数，然而，发现了明显的差异。
The electrical conductivity and temperature coefficient of resistance of polycrystalline platinum nanofilms have been investigated experimentally and theoretically. The results show that these electrical properties have been greatly reduced mainly by grain boundary scattering. By applying the theory of Mayadas and co-workers [Appl. Phys. Lett. 14, 345 (1969); Phys. Rev. B 1, 1382 (1970)] to predict the electrical conductivity and temperature coefficient of resistance with the same reflection coefficient, however, obvious discrepancies have been found. These discrepancies indicate that Drude’s relation for bulk metals cannot be applied directly in the nanosized grain interior of polycrystalline metallic films.