The arbitrary relation between probability of error and measurement subset
The arbitrary relation between probability of error and measurement subset
复制标题
误差概率与测量子集之间的任意关系
DOI:
10.1080/01621459.1980.10477438
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发表时间:
1980
影响因子:
3.7
通讯作者:
J. V. Campenhout
中科院分区:
文献类型:
--
作者:
J. V. Campenhout
Abstract Let Pe (S) denote the Bayes risk (probability of error) in testing two equally likely hypotheses H 0 versus H 1 using measurements in S, a subset of the set of possible measurements. The possible values of Pe (S) as a function of S are considered. It has been shown that all orderings on Pe (S), satisfying the natural monotonicity constraint S′ ⊂ S ⇒ Pe (S′) ≥ Pe (S) can occur. We show that no other restrictions exist on the numbers Pe (S), 0 < Pe (S) ≤ ½, thus extending the known result from the achievability of orderings to the achievability of numerically specified sequences. Thus nonexhaustive (suboptimal) measurement-selection algorithms can be arbitrarily bad.