Silicide precipitation in a γ-based Ti-47Al-2w-0.5Si alloy
Silicide precipitation in a γ-based Ti-47Al-2w-0.5Si alloy
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DOI:
10.1016/s1359-6462(97)00077-8
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发表时间:
1997-07
影响因子:
6
通讯作者:
W. Yin;V. Lupinc
中科院分区:
文献类型:
--
作者:
W. Yin;V. Lupinc
Although some work on microstructure of silicides in {gamma}-TiAl alloys has been done, it is restricted to the alloys containing high content of silicon ({approximately}3at.%). Furthermore, to the authors` knowledge, the crystal orientation relation between silicide and {beta} matrix that is stabilized to room temperature in the alloys containing transition elements (such as Nb, V, W, Cr), has not been reported yet. The present investigation was undertaken /to study the silicides in a {gamma}-TiAl base alloy with 2 at.% W addition containing 0.28--0.59 at.% Si after different heat treatments, to understand the effects of silicon content and heat treatment on the formation and morphology of silicides.