Reduced inspection time in active thermographic non-destructive testing of low-thermal-conductivity materials

Reduced inspection time in active thermographic non-destructive testing of low-thermal-conductivity materials
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减少低导热材料主动热成像无损检测的检查时间

DOI:
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发表时间:
2018
期刊:
影响因子:
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通讯作者:
Shin Utsunomiya
Shin Utsunomiya
中科院分区:
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文献类型:
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作者:
Masashi Ishikawa;Masashi Koyama;Hideyuki Kasano;Hiroshi Hatta;Shin Utsunomiya

文献摘要

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