SCANNING MICRODEFORMATION MICROSCOPY
SCANNING MICRODEFORMATION MICROSCOPY
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DOI：
10.1063/1.108592
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发表时间：
1993-02-22
影响因子：
4
通讯作者：
STHAL, F
中科院分区：
文献类型：
--
作者：
CRETIN, B;STHAL, F
我们开发了一种基于振动接触尖端和压电检测的新型扫描显微镜。扫描样品揭示表面形貌，主要是地下弹性特性。初步图像显示了金属样品表面和地下的不均匀性。在近场显微镜中，横向分辨率基本上与尖端直径有关。
We have developed a new scanning microscope based on a vibrating contact tip and piezoelectric detection. Scanning the sample reveals surface topography and mainly, subsurface elastic properties. The preliminary images presented show surface and subsurface inhomogeneities in metallic samples. Lateral resolution is essentially related to the tip diameter as in near-field microscopes.