Optical/UV and X-Ray Microwave Kinetic Inductance Strip Detectors
Optical/UV and X-Ray Microwave Kinetic Inductance Strip Detectors
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光学/紫外线和 X 射线微波动感带状探测器
DOI：
10.1007/s10909-007-9686-1
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发表时间：
2008
影响因子：
2
通讯作者：
J. Zmuidzinas
中科院分区：
文献类型：
--
作者：
B. Mazin;M. Eckart;B. Bumble;S. Golwala;P. Day;J. Gao;J. Zmuidzinas
微波动感电感探测器 (MKID) 是超导探测器，当库珀对损坏时，通过使用高品质因数谐振电路来感测超导薄膜表面阻抗的变化。我们正在开发条状探测器，在矩形钽条的两端均配有铝制 MKID 传感器。这些器件可以为从 IR 到 X 射线的单光子提供具有高量子效率、能量分辨率和微秒时间分辨率的一维空间成像。我们已经展示了在 6 keV 下能量分辨率为 62 eV 的 X 射线条探测器，并希望能够大幅改进。我们还将报告 Palomar 200 英寸望远镜计划相机的光学阵列方面的进展。
Microwave Kinetic Inductance Detectors (MKIDs) are superconducting detectors that sense the change in the surface impedance of a thin superconducting film when Cooper Pairs are broken by using a high quality factor resonant circuit. We are developing strip detectors that have aluminum MKID sensors on both ends of a rectangular tantalum strip. These devices can provide one dimensional spatial imaging with high quantum efficiency, energy resolution, and microsecond time resolution for single photons from the IR to the X-ray. We have demonstrated X-ray strip detectors with an energy resolution of 62 eV at 6 keV, and hope to improve this substantially. We will also report on our progress towards optical arrays for a planned camera for the Palomar 200″ telescope.