In situ spectroscopic ellipsometry and RHEED monitored growth of InN nanocolumns by molecular beam epitaxy
In situ spectroscopic ellipsometry and RHEED monitored growth of InN nanocolumns by molecular beam epitaxy
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DOI：
10.1016/j.jcrysgro.2006.11.111
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发表时间：
2007-04
影响因子：
1.8
通讯作者：
Xinqiang Wang;S. Che;Y. Ishitani;A. Yoshikawa
中科院分区：
文献类型：
--
作者：
Xinqiang Wang;S. Che;Y. Ishitani;A. Yoshikawa
