High resolution metrology of autoionizing states through Raman interferences

High resolution metrology of autoionizing states through Raman interferences
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通过拉曼干涉进行自电离态的高分辨率计量

DOI:
10.1088/1742-6596/2494/1/012003
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发表时间:
2023
期刊:
Journal of Physics: Conference Series
影响因子:
--
通讯作者:
Sandhu, A.
Sandhu, A.
中科院分区:
--
文献类型:
--
作者:
Plunkett, A.;Wood, J. K.;Alarcón, M. A.;Biswas, D.;Greene, C. H.;Sandhu, A.

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电子波包的计量通常是用光电子干涉技术进行的。然而,这种方法中使用的超短光脉冲对能量分辨率造成了限制。在这里,我们先进的超快光电子干涉测量获得了高的时间和光谱分辨率。我们方法的关键在于用探测脉冲激发拉曼干扰,同时在一个单独的延迟检测步骤中监测自电离电子产额的变化。作为原理的证明,我们演示了这一技术,以获得自旋-轨道分裂电离阈值之间的自电离nf‘波包的分量。我们从干涉图中提取了振幅和相位,并将实验结果与二阶微扰理论计算结果进行了比较。这种电子动力学的高分辨率探测和计量学为研究分子波包开辟了道路。
Metrology of electron wavepackets is often conducted with the technique of photoelectron interferometry. However, the ultrashort light pulses employed in this method place a limit on the energy resolution. Here, weadvance ultrafast photoelectron interferometry access both high temporal and spectral resolution. The key to our approach lies in stimulating Raman interferences with a probe pulse and while monitoring the modification of the autoionizing electron yield in a separate delayed detection step. As a proof of the principle, we demonstrated this technique to obtain the components of an autoionizing nf'wavepacket between the spin-orbit split ionization thresholds in argon. We extracted the amplitudes and phases from the interferogram and compared the experimental results with second-order perturbation theory calculations. This high resolution probing and metrology of electron dynamics opens the path for study of molecular wavepackets.
DOI: 10.1088/0953-4075/21/23/005
发表时间: 1988
期刊: Journal of Physics B
影响因子: --
作者:
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