High resolution metrology of autoionizing states through Raman interferences
High resolution metrology of autoionizing states through Raman interferences
复制标题
通过拉曼干涉进行自电离态的高分辨率计量
DOI:
10.1088/1742-6596/2494/1/012003
复制
发表时间:
2023
期刊:
影响因子:
--
通讯作者:
Sandhu, A.
中科院分区:
文献类型:
--
作者:
Plunkett, A.;Wood, J. K.;Alarcón, M. A.;Biswas, D.;Greene, C. H.;Sandhu, A.
Metrology of electron wavepackets is often conducted with the technique of photoelectron interferometry. However, the ultrashort light pulses employed in this method place a limit on the energy resolution. Here, weadvance ultrafast photoelectron interferometry access both high temporal and spectral resolution. The key to our approach lies in stimulating Raman interferences with a probe pulse and while monitoring the modification of the autoionizing electron yield in a separate delayed detection step. As a proof of the principle, we demonstrated this technique to obtain the components of an autoionizing nf'wavepacket between the spin-orbit split ionization thresholds in argon. We extracted the amplitudes and phases from the interferogram and compared the experimental results with second-order perturbation theory calculations. This high resolution probing and metrology of electron dynamics opens the path for study of molecular wavepackets.
DOI:
10.1088/0953-4075/21/23/005
发表时间:
1988
期刊:
Journal of Physics B
影响因子:
--
作者:
M. Pellarin;J. Vialle;M. Carré;J. Lermé;M. Aymar
通讯作者:
M. Aymar
DOI:
10.1098/rsta.1998.0170
发表时间:
1998
期刊:
Philosophical Transactions of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences
影响因子:
--
作者:
J. Ramswell;V. Stavros;Q. Hong;H. H. Fielding
通讯作者:
H. H. Fielding
影响因子:
56.9
作者:
D. Villeneuve;P. Hockett;M. Vrakking;H. Niikura
通讯作者:
D. Villeneuve;P. Hockett;M. Vrakking;H. Niikura