Intelligent Human Computer Interaction - 13th International Conference, IHCI 2021, Kent, OH, USA, December 20-22, 2021, Revised Selected Papers

Intelligent Human Computer Interaction - 13th International Conference, IHCI 2021, Kent, OH, USA, December 20-22, 2021, Revised Selected Papers
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智能人机交互 - 第 13 届国际会议,IHCI 2021,美国俄亥俄州肯特,2021 年 12 月 20-22 日,修订后的精选论文

DOI:
10.1007/978-3-030-98404-5_49
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发表时间:
2022
期刊:
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影响因子:
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通讯作者:
Zou L
Zou L
中科院分区:
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文献类型:
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作者:
Zou L

文献摘要

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复杂的句法可能会导致翻译过程中认知努力的增加。然而,目前还不清楚什么样的句法复杂性对翻译效果有更大的影响。本文采用了几种句法分析方法来探讨句法复杂性对英汉视译质量的影响。我们已经操作化的句法复杂性的六个度量,即,不完全依存理论度量(IDT),依存局部性理论度量(DLT),IDT和DLT的组合度量(IDT+DLT),左嵌入度量(LE),嵌套名词距离度量(NND),和双语复杂性比率度量(BRC)。三位专业翻译人员使用MQM-derived错误分类法手动注释了翻译错误,其中包括准确性,流畅性和风格错误,每个错误都是关键或次要错误。我们采用加权Fleiss Kappa评分评估评估者间一致性。我们发现IDT和IDT+DLT指标与视景判读错误之间存在很强的相关性。我们还发现,英语和汉语之间的语言特定的句法差异,如分支方向和名词修饰语可以有很大的影响准确性和关键错误。
Complex syntax may lead to increased cognitive effort during translation. However, it is unclear what kinds of syntactic complexity have a stronger impact on translation performance. In this paper, we employ several syntactic metrics which enable us to explore the impact of syntactic complexity on the quality in English-to-Chinese sight interpreting. We have operationalized syntactic complexity by six metrics, namely, Incomplete Dependency Theory metric (IDT), Dependency Locality Theory metric (DLT), Combined IDT and DLT metric (IDT+DLT), Left Embeddedness metric (LE), Nested Nouns Distancemetric (NND), and Bilingual Complexity Ratio metric (BRC). Three professional translators have manually annotated translation errors using MQM-derived error taxonomies, which includes accuracy, fluency, and style errors, each as critical or minor errors. We assessed inter-rater agreement by adopting weighted Fleiss’ Kappa scores. We found that there are strong correlations between the IDT and IDT+DLT metrics and sight interpreting errors. We also found that language-specific syntactic differences between English and Chinese such as directions of branching and noun modifiers can have a strong influence on accuracy and critical errors.