Tweedie Exponential Dispersion Processes for Degradation Modeling, Prognostic, and Accelerated Degradation Test Planning
Tweedie Exponential Dispersion Processes for Degradation Modeling, Prognostic, and Accelerated Degradation Test Planning
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用于降解建模、预测和加速降解测试计划的 Tweedie 指数离散过程
DOI:
10.1109/tr.2019.2955596
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发表时间:
2020-09
影响因子:
5.9
通讯作者:
Pan Ershun
中科院分区:
文献类型:
--
作者:
Chen Zhen;Xia Tangbin;Li Yanting;Pan Ershun
Degradation modeling is an important method of reliability analysis for highly reliable products. The common degradation models are based on specific stochastic processes. This limits the widespread application of the modeling methods. A unified approach
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影响因子:
5.9
作者:
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通讯作者:
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影响因子:
8.4
作者:
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通讯作者:
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影响因子:
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影响因子:
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作者:
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