Mid-infrared reflectivity and ellipsometry measurements on single-crystal YBa2Cu3O7 and Bi2Sr2CuO6+y.
Mid-infrared reflectivity and ellipsometry measurements on single-crystal YBa2Cu3O7 and Bi2Sr2CuO6+y.
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单晶 YBa2Cu3O7 和 Bi2Sr2CuO6 y 的中红外反射率和椭圆光度测量。
DOI:
10.1103/physrevb.40.6884
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发表时间:
1989
期刊:
影响因子:
--
通讯作者:
Barboux
中科院分区:
文献类型:
--
作者:
Watanabe;Wang;Lyon;Tsui;Ong;Tarascon;Barboux
We have measured the room-temperature reflectivity of 90-K'' single crystals YBa{sub 2}Cu{sub 3}O{sub 7} in the frequency range 600--9000 cm{sup {minus}1}. The reflectivity {ital R} in these highly conducting samples ({rho}{sub {ital ab}}=150 {mu}{Omega} cm at 290 K) is found to be higher than in previous reports. We fit {ital R} to a simple Drude-Lorentz model and compare the fit parameters with the dc transport values. (The effective-mass ratio of the carriers is found to be 2.0, and the scattering rate {h bar}/{tau} is 3.1{ital k}{sub {ital B}}T at room temperature.) Ellipsometry measurements have also been performed using transverse-electric and transverse-magnetic polarizations. The dielectric dispersion derived from ellipsometry shows some important deviations from the Drude-Lorentz model. Reflectivity data from nonsuperconducting crystals of Bi{sub 2}Sr{sub 2}CuO{sub 6+{ital y}} are also reported.