Transmission electron microscopy of fluorapatite–gelatine composite particles prepared using focused ion beam milling
Transmission electron microscopy of fluorapatite–gelatine composite particles prepared using focused ion beam milling
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DOI：
10.1111/j.0022-2720.2004.01352.x
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发表时间：
2004-06
影响因子：
2
通讯作者：
C. Volkert;S. Busch;B. Heiland;G. Dehm
中科院分区：
文献类型：
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作者：
C. Volkert;S. Busch;B. Heiland;G. Dehm
本文采用两种基于聚焦离子束(FIB)球磨的方法制备了氟磷灰石-明胶复合粒子，并对其进行了透射电子显微镜(TEM)研究。对FIB制备的样品进行了透射电子显微镜研究，并与用超微结构制备的样品进行了比较。结果表明，超微切片法对磷灰石有明显的裂解作用，而离子束可用于制作高质量、无裂纹、无明显损伤的样品。对制备的样品进行了透射电子显微镜观察，证实了氟磷灰石复合颗粒是由拉长的、择优取向的颗粒组成，晶界含有许多充满非晶相的小间隙。
In this paper, synthetic fluorapatite–gelatine composite particles are prepared for transmission electron microscopy (TEM) studies using two methods based on focused ion beam (FIB) milling. TEM studies on the FIB‐prepared specimens are compared with TEM observations on samples prepared using an ultramicrotome. The results show that ultramicrotome slicing causes significant cracking of the apatite, whereas the ion beam can be used to make high‐quality, crack‐free specimens with no apparent ion beam‐induced damage. The TEM observations on the FIB‐prepared samples confirm that the fluorapatite composite particles are composed of elongated, preferentially orientated grains and reveal that the grain boundaries contain many small interstices filled with an amorphous phase.