High-Speed Phase-Modulation Atomic Force Microscopy in Constant-Amplitude Mode Capable of Simultaneous Measurement of Topography and Energy Dissipation
High-Speed Phase-Modulation Atomic Force Microscopy in Constant-Amplitude Mode Capable of Simultaneous Measurement of Topography and Energy Dissipation
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DOI:
10.1143/jjap.47.6121
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发表时间:
2008-07
影响因子:
1.5
通讯作者:
Y. Li;N. Kobayashi;H. Nomura;Y. Naitoh;M. Kageshima;Y. Sugawara
中科院分区:
文献类型:
--
作者:
Y. Li;N. Kobayashi;H. Nomura;Y. Naitoh;M. Kageshima;Y. Sugawara
We have developed high-speed phase-modulation atomic force microscopy (PM-AFM) in a constant-amplitude (CA) mode. Using this imaging mode, we have theoretically demonstrated that energy dissipation due to tip–sample interaction can be obtained from the excitation amplitude of a cantilever. Moreover, we have found that the photothermal excitation method is better than the acoustic excitation method for cantilever oscillation in liquids. For the first time, we have demonstrated that a homebuilt high-speed PM-AFM in the CA mode has the capability to simultaneously measure the topography and energy dissipation with a material-specific contrast for a PS/PIB polymer-blend film.