High-Speed Phase-Modulation Atomic Force Microscopy in Constant-Amplitude Mode Capable of Simultaneous Measurement of Topography and Energy Dissipation

High-Speed Phase-Modulation Atomic Force Microscopy in Constant-Amplitude Mode Capable of Simultaneous Measurement of Topography and Energy Dissipation
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DOI:
10.1143/jjap.47.6121
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发表时间:
2008-07
影响因子:
1.5
通讯作者:
Y. Li;N. Kobayashi;H. Nomura;Y. Naitoh;M. Kageshima;Y. Sugawara
Y. Li;N. Kobayashi;H. Nomura;Y. Naitoh;M. Kageshima;Y. Sugawara
中科院分区:
物理与天体物理4区
文献类型:
--
作者:
Y. Li;N. Kobayashi;H. Nomura;Y. Naitoh;M. Kageshima;Y. Sugawara

文献摘要

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我们开发了恒幅(CA)模式的高速相位调制原子力显微镜(PM-AFM)。使用这种成像模式,我们从理论上证明,可以从悬臂梁的激励振幅中获得由于尖端与样品相互作用引起的能量耗散。此外,我们发现对于液体中的悬臂振荡,光热激发方法比声激发方法更好。我们首次证明,CA 模式下的自制高速 PM-AFM 能够同时测量 PS/PIB 聚合物共混薄膜的形貌和能量耗散以及特定材料的对比度。
We have developed high-speed phase-modulation atomic force microscopy (PM-AFM) in a constant-amplitude (CA) mode. Using this imaging mode, we have theoretically demonstrated that energy dissipation due to tip–sample interaction can be obtained from the excitation amplitude of a cantilever. Moreover, we have found that the photothermal excitation method is better than the acoustic excitation method for cantilever oscillation in liquids. For the first time, we have demonstrated that a homebuilt high-speed PM-AFM in the CA mode has the capability to simultaneously measure the topography and energy dissipation with a material-specific contrast for a PS/PIB polymer-blend film.