Tip shape effect on hot nanoindentation hardness and modulus measurements
Tip shape effect on hot nanoindentation hardness and modulus measurements
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DOI：
10.1007/s12541-014-0499-2
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发表时间：
2014-08
影响因子：
1.9
通讯作者：
M. Monclús;S. Lotfian;J. Molina-Aldareguia
中科院分区：
文献类型：
--
作者：
M. Monclús;S. Lotfian;J. Molina-Aldareguia
本文主要研究高温纳米压痕试验中金刚石压头的针尖形状和性能退化。准确的压头面积函数（IAF）是正确测量机械性能的仪器化压痕技术（IIT），特别是在高温（HT）纳米压痕技术（IIT）的基本。然而，作为一种相对较新的技术，缺乏足够的信息。本文研究了在室温和T=100°C、200°C和300°C下对1 mm厚的SiC和Al薄膜进行高温纳米压痕测试后，布氏压头尖端的形状和退化。IAFs确定的参考方法和原子力显微镜（AFM），后者提供更高的接触面积，虽然从这两种方法中提取的尖端缺陷值是在良好的协议。在SiC上的HT纳米压痕后通过AFM检查尖端，揭示了钝的尖端和对新的IAF的需要。这项工作强调了定期进行压头形状校准的重要性，特别是在压头和扫描在T>200°C时容易氧化的硬样品和金属时，压头很容易受到污染。
This paper focuses on tip shape and degradation of diamond indenters upon high temperature nanoindentation tests. Accurate indenter area functions (IAFs) are essential for the correct measurement of mechanical properties by instrumented indentation techniques (IIT), particularly during high temperature (HT) nanoindentation. However, being a relatively new technique, sufficient information is lacking. This paper examines the shape and degradation of a Berkovich indenter tip after HT nanoindentation testing of 1 mm-thick SiC and Al thin films at room temperature and at T=100°C, 200°C and 300°C. IAFs were determined by the reference method and by atomic force microscopy (AFM), with the latter giving higher contact areas, although tip defect values extracted from both methods were in good agreement. Examination of the tip by AFM after HT nanoindentation on SiC reveals a blunt tip and the need for a new IAF. The work emphasizes the importance of carrying out indenter tip shape calibrations on a regular basis, especially when indenting and scanning hard samples and metals that readily oxidise at T>200°C, where the tip gets easily contaminated.