Free nanoparticles studied by soft X-rays
Free nanoparticles studied by soft X-rays
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DOI：
10.1016/j.cplett.2012.11.051
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发表时间：
2013-02-20
影响因子：
2.8
通讯作者：
Ruehl, E.
中科院分区：
文献类型：
--
作者：
Antonsson, E.;Bresch, H.;Ruehl, E.
综述了纳米粒子束在孤立纳米物质制备和表征中的应用。这是一个一般的制备方案，这被证明是广泛使用的，每当纳米级物质的固有特性，而不与其他粒子或基板的任何相互作用的兴趣。尺寸范围从几纳米到微米，其中可以研究各种各样的物质和材料。同样广泛的是检测方案和性质，可以通过这种方法进行研究。本文综述了孤立纳米粒子的各种性质，包括它们的尺寸，表面性质，光学常数，以及它们的局部电子结构。(C)2012爱思唯尔有限公司版权所有。
The use of nanoparticle beams for the preparation and characterization of isolated nanoscopic matter is reviewed. It is a general preparation scheme which is shown to be of broad use, whenever the intrinsic properties of nanoscopic matter without any interactions with other particles or substrates are of interest. The size regime spans a few nanometers up to the micron sizes, wherein a large variety of substances and materials can be studied. Similarly broad are the detection schemes and properties, which can be investigated by this approach. This review covers various properties of isolated nanoparticles, including their size, surface properties, optical constants, as well as their local electronic structure. (C) 2012 Elsevier B.V. All rights reserved.