Mixed-phase β-Ga2O3 and SnO2 metal-semiconductor-metal photodetectors with extended detection range from 293 nm to 330 nm
Mixed-phase β-Ga2O3 and SnO2 metal-semiconductor-metal photodetectors with extended detection range from 293 nm to 330 nm
复制标题
混合相 β-Ga2O3 和 SnO2 金属-半导体-金属光电探测器,检测范围从 293 nm 扩展到 330 nm
DOI:
10.1016/j.jallcom.2020.157080
复制
发表时间:
2021-02-05
影响因子:
6.2
通讯作者:
Li, Xiu-Yan
中科院分区:
文献类型:
--
作者:
Fan, Ming-Ming;Cao, Ling;Li, Xiu-Yan
In this article, we demonstrate beta-Ga2O3 and SnO2 mixed-phase thin films with dominant ((2) over bar 01)-beta-Ga2O3 and (200)-SnO2 orientations on c-face sapphire (c-Al2O3) by chemical vapor deposition in a tube furnace. Transmission electron microscopy (TEM) reveals their simultaneous growth on substrate due to the small mismatches of ((2) over bar 01)-beta-Ga2O3/c-Al2O3 (similar to 3%) and (200)-SnO2/c-Al2O3 (similar to 0.6%). Therefore, we also successfully demonstrate preferred-orientation ((2) over bar 01)-beta-Ga2O3 and (200)-SnO2 mixed-phase thin films by controlling the Sn and Ga ratios in precursors. At 40 V, the photoelectric properties of metal-semiconductor-metal (MSM) photodetectors are modulated with more SnO2 content in mixed-phase thin films, including the dark current from 11 pA to 4 nA, the peak response in UVC from 240 nm (2 mA/W) to 260 nm (1.15 A/W), the tunable cut-off wavelength from 274 nm to 297 nm, and the extended detection range at long wavelength from 293 nm to 330 nm. Our devices show Ga2O3-like photoresponse properties rather than SnO2-like properties with lower dark current, comparable responsivity and detectivity, and faster response time than the performances of parts of the pure and mixed-phase Ga2O3-based photodetectors with untunable detection rang, which is expected to extend wider applications of other Ga2O3-based mixed-phase materials during doping or alloying, and paves a new and feasible way to realize high-performance Ga2O3-based photodetectors with controllable detection range. (c) 2020 Elsevier B.V. All rights reserved.