A resistometric and neutron diffraction investigation of the Nb-H system at high hydrogen concentrations
A resistometric and neutron diffraction investigation of the Nb-H system at high hydrogen concentrations
复制标题
高氢浓度下 Nb-H 系统的电阻测量和中子衍射研究
DOI：
10.1088/0305-4608/13/2/027
复制
发表时间：
1983
期刊：
影响因子：
--
通讯作者：
F. Schondube
中科院分区：
文献类型：
--
作者：
J. Welter;F. Schondube
各种 NbHx 样品的电阻率在 80-420K 温度范围内测量，氢浓度 x 在 0 到 1.1 之间变化。这些测量结果通过 x=0.825 样品的中子衍射研究得到补充。电阻率和上部结构反射的温度依赖性的奇点用于识别相变。基于费米面模型讨论了电阻率的浓度依赖性，费米面模型指出与 N 对称点相关的片在氢化时消失。指出了氢化物的电阻率行为和上部结构反射强度之间的相似性，并将其解释为过渡前效应。
The electrical resistivity of various NbHx samples has been measured in the temperature range 80-420K for hydrogen concentrations x varying between 0 and 1.1. These measurements were supplemented by a neutron diffraction study of a sample with x=0.825. The singularities in the temperature dependence of the resistivity and the superstructure reflections are used to identify phase transitions. The concentration dependence of the resistivity is discussed on the basis of a model of the Fermi surface which states that the sheet associated with the N symmetry points disappears on hydrogenation. Similarities between the behaviour of the resistivity and the intensity of the superstructure reflections of the hydride are pointed out and interpreted as pre-transitional effects.