Inflight Antenna Pattern Measurement for Bistatic Synthetic Aperture Radar Systems
Inflight Antenna Pattern Measurement for Bistatic Synthetic Aperture Radar Systems
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DOI：
10.1109/lawp.2007.905013
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发表时间：
2007-09
影响因子：
4.2
通讯作者：
Wen-qin Wang
中科院分区：
文献类型：
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作者：
Wen-qin Wang
合成孔径雷达（SAR）需要精确的机载天线方向图，因此图像像素强度可以直接用平均后向散射系数表示。对于发射机和接收机分别安装在不同平台上的双基地合成孔径雷达（BiSAR），传统的无源定标器不再适用。因此，在这封信中描述了一种方法，如何确定机载天线方向图的双合成孔径雷达系统。该技术适用于高分辨率合成孔径雷达由于非常高的动态范围。更重要的是，该技术使用信号编码将应答器与背景解耦，这大大提高了测量性能。理论分析和仿真结果也证明了该方法的有效性。
Precise inflight antenna pattern should be known for synthetic aperture radar (SAR), so that an image pixel intensity is directly expressed in terms of the mean surface backscatter coefficient. For bistatic SAR (BiSAR), in which the transmitter and receiver are mounted on separate platforms, conventional passive calibrators are not applicable any more. As such, an approach is described on how to determine the inflight antenna patterns for BiSAR systems in this letter. This technique is suitable for high-resolution SAR due to the very high dynamic range. More importantly, this technique uses signal encoding to decouple the transponder from the background, which greatly improve the measurement performance. Theoretical analysis and simulation results also demonstrate its validity.