Adaptive Testing: Dealing with Process Variability
Adaptive Testing: Dealing with Process Variability
复制标题
自适应测试：处理过程变异
DOI：
10.1109/mdt.2011.118
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发表时间：
2011
影响因子：
--
通讯作者：
P. Maxwell
中科院分区：
文献类型：
--
作者：
P. Maxwell
本文介绍了自适应测试的发展，以满足不断增长的动态且经济高效地定制 IC 测试以有区别地管理制造工艺变化的需求。介绍了不同程度的采用，以及其好处和使用示例。最后，讨论了未来发展面临的挑战。
This article describes the development of adaptive testing in response to the ever-growing need to dynamically and cost-effectively tailor IC testing to discriminately manage manufacturing process variations. Various degrees of adoption are presented, together with benefits and examples of its use. Finally, challenges for future development are discussed.