Unique photoluminescence degradation/recovery phenomena in trivalent ion-activated phosphors
Unique photoluminescence degradation/recovery phenomena in trivalent ion-activated phosphors
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DOI：
10.1063/1.4930089
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发表时间：
2015-09
影响因子：
3.2
通讯作者：
K. Sawada;S. Adachi
中科院分区：
文献类型：
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作者：
K. Sawada;S. Adachi
利用x射线衍射测量、光致发光（PL）分析、PL激发光谱和PL衰减分析，观察和研究了红发Tb3Ga5O12:Eu3+ (TGG:Eu3+)荧光粉的光致发光强度衰减。在弱紫外光（λ 350 nm）下，TGG:Eu3+荧光体的发光强度明显降低。在λex = 355和266 nm激发下测量的发光衰减动力学表明，TGG:Eu3+荧光粉的降解/恢复过程是由其内部形成的电子陷阱引起的。TGG中的Tb3+发射表现出与TGG:Eu3+荧光粉基本相同的降解特性。现在的lumin…
Photo-induced luminescence intensity degradation in red-emitting Tb3Ga5O12:Eu3+ (TGG:Eu3+) phosphor is observed and studied using x-ray diffraction measurement, photoluminescence (PL) analysis, PL excitation spectroscopy, and PL decay analysis. The red-emitting TGG:Eu3+ phosphor exhibits remarkable degradation in the PL intensity under weak UV light (λ 350 nm) light. The luminescence decay dynamics measured by excitation at λex = 355 and 266 nm suggest that the present degradation/recovery processes are caused by the electron traps formed in the TGG:Eu3+ phosphor. The Tb3+ emission in TGG shows the essentially same degradation characteristics as those observed in the TGG:Eu3+ phosphor. The present lumin...