Current density at failure of twinned silver nanowires
Current density at failure of twinned silver nanowires
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DOI：
10.1088/1361-6528/ac64af
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发表时间：
2022-04
期刊：
影响因子：
3.5
通讯作者：
M. Waliullah;Rodrigo A. Bernal
中科院分区：
文献类型：
--
作者：
M. Waliullah;Rodrigo A. Bernal
银纳米线具有优异的电学、机械和光学性能，在可拉伸和透明电子领域具有广泛的潜在应用。为了在电子器件中成功应用，需要评估这些纳米线的电可靠性。实验研究了93根直径在53 ~ 173 nm之间的五孪晶银纳米线的断裂电流密度行为。失效时的电流密度分布很广，平均值为9.7 × 107 A cm−2，标准差为2.96 × 107 A cm−2。热传递模型来解释的结果，和威布尔统计被用来量化故障概率，从而为未来的设计提供指导方针，这些纳米线的基础上。在测量中观察到的散射归因于样品之间的表面粗糙度变化，这导致局部热点的高电流密度。这些结果量化了银纳米线的焦耳加热电可靠性，并强调了传热在提高电可靠性方面的重要性。
Silver nanowires have a wide range of potential applications in stretchable and transparent electronics due to their excellent electrical, mechanical, and optical properties. For a successful application in electronic devices, evaluating the electrical reliability of these nanowires is required. We have studied experimentally the behavior of current density at failure for penta-twinned silver nanowires with diameters between 53 and 173 nm, for 93 samples. The current densities at failure are widely scattered, have an average of 9.7 × 107 A cm−2, and a standard deviation of 2.96 × 107 A cm−2. Heat-transfer modeling is employed to explain the results, and Weibull statistics are used to quantify failure probabilities, thus offering guidelines for future designs based on these nanowires. The scatter observed in the measurements is attributed to surface-roughness variations among samples, which lead to local hot spots of high current density. These results quantify the Joule heating electrical reliability of silver nanowires and highlight the importance of heat transfer in increasing it.