Hard-X-ray Phase-Difference Microscopy with a Low-Brilliance Laboratory X-ray Source
Hard-X-ray Phase-Difference Microscopy with a Low-Brilliance Laboratory X-ray Source
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DOI：
10.1143/apex.4.062502
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发表时间：
2011-06-01
影响因子：
2.3
通讯作者：
Momose, Atsushi
中科院分区：
文献类型：
--
作者：
Kuwabara, Hiroaki;Yashiro, Wataru;Momose, Atsushi
我们开发了一种使用低亮度X射线源的硬X射线相位成像显微镜方法。该显微镜由一个样品，菲涅耳波带板，透射光栅，和一个源光栅创建一个阵列的相互不相干的X射线源。显微镜生成展示样品的双特征的图像，该双特征具有由距离分开的相反符号，该图像被处理以生成相位图像。该方法是定量的，即使是非弱相位对象，很难被广泛使用的Zernike相衬显微镜定量检查，它在材料和生物科学领域有潜在的广泛应用。(C)2011日本应用物理学会
We have developed a hard-X-ray phase-imaging microscopy method using a low-brilliance X-ray source. The microscope consists of a sample, a Fresnel zone plate, a transmission grating, and a source grating creating an array of mutually incoherent X-ray sources. The microscope generates an image exhibiting twin features of the sample with opposite signs separated by a distance, which is processed to generate a phase image. The method is quantitative even for non-weak-phase objects that are difficult to be quantitatively examined by the widely used Zernike phase-contrast microscopy, and it has potentially broad applications in the material and biological science fields. (C) 2011 The Japan Society of Applied Physics