Mapping Local Charge Recombination Heterogeneity by Multidimensional Nanospectroscopic Imaging
Mapping Local Charge Recombination Heterogeneity by Multidimensional Nanospectroscopic Imaging
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DOI：
10.1126/science.1227977
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发表时间：
2012-12-07
期刊：
影响因子：
56.9
通讯作者：
Weber-Bargioni, A.
中科院分区：
文献类型：
--
作者：
Bao, Wei;Melli, M.;Weber-Bargioni, A.
随着材料的功能越来越依赖于局部的物理和电子特性，具有真正纳米尺度空间分辨率的光学探测物质的重要性日益增加。在这项工作中，我们以深度亚波长分辨率绘制了单个纳米线内的局部陷阱状态对载流子重组的影响。这是通过基于纳米光学器件的多维纳米光谱成像实现的。该设备放置在扫描探头的末端，可提供最佳的近场特性，包括高效的远场到近场耦合、超大场增强、几乎无背景成像、不依赖于样品要求和宽带操作。我们通过激发和收集探针对磷化铟纳米线进行了类似于40纳米分辨率的高光谱成像，揭示了其他方法无法获得的单个纳米线沿线的光电结构。
As materials functionality becomes more dependent on local physical and electronic properties, the importance of optically probing matter with true nanoscale spatial resolution has increased. In this work, we mapped the influence of local trap states within individual nanowires on carrier recombination with deeply subwavelength resolution. This is achieved using multidimensional nanospectroscopic imaging based on a nano-optical device. Placed at the end of a scan probe, the device delivers optimal near-field properties, including highly efficient far-field to near-field coupling, ultralarge field enhancement, nearly background-free imaging, independence from sample requirements, and broadband operation. We performed similar to 40-nanometer-resolution hyperspectral imaging of indium phosphide nanowires via excitation and collection through the probes, revealing optoelectronic structure along individual nanowires that is not accessible with other methods.