Measurements of electron-impact ionization cross sections of argon, krypton, and xenon by comparison with photoionization
Measurements of electron-impact ionization cross sections of argon, krypton, and xenon by comparison with photoionization
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通过与光电离比较来测量氩、氪和氙的电子轰击电离截面
DOI：
10.1103/physreva.61.022723
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发表时间：
2000
期刊：
影响因子：
--
通讯作者：
G. Ulm
中科院分区：
文献类型：
--
作者：
A. Sorokin;L. Shmaenok;S. Bobashev;B. Möbus;M. Richter;G. Ulm
测量了Ar、Kr和Ar中电子碰撞电离和光电离的总截面比，电子能量范围为140 ~ 4000 eV，光子能量范围为16 ~ 1012 eV。使用结合两种最新仪器发展的装置，实现了相对较低的相对标准不确定度（1.3-1.9%）。第一个项目与一个用于确定软X射线和真空紫外光子通量的高精度装置，即低温电子替代辐射计有关。第二个是一个升级的电离室，用于精确比较电子和光子碰撞的总离子产额。在我们测量的截面比和已知的总光电离截面数据的基础上，我们推导了稀有气体的绝对总电子碰撞电离截面，相对标准不确定度低至2%。
Ratios of total cross sections for electron-impact ionization and photoionization in Ar, Kr, and Xe in the energy range from 140 to 4000 eV for electrons and from 16 to 1012 eV for photons were measured. Comparatively low relative standard uncertainties of 1.3–1.9% were achieved using an apparatus combining two recent instrumental developments. The first is associated with a highly accurate device for the determination of soft-x-ray and vacuum-UV photon flux, a cryogenic electrical substitution radiometer. The second is an upgraded ionization chamber for the precise comparison of total-ion yields for electron and photon impact. On the basis of our measured cross-section ratios and well-known total photoionization cross-section data, we deduced absolute total electron-impact ionization cross sections of the rare gases with relative standard uncertainties as low as 2%.