Statistical Fault Injection

Statistical Fault Injection
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统计错误注入

DOI：
10.1109/dsn.2008.4630080
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发表时间：
2008
期刊：
2008 IEEE International Conference on Dependable Systems and Networks With FTCS and DCC (DSN)
影响因子：
--
通讯作者：
P. Sanda
P. Sanda
中科院分区：
--
文献类型：
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作者：
Pradeep Ramachandran;P. Kudva;J. W. Kellington;J. Schumann;P. Sanda

文献摘要

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针对现代微处理器的粒子束加速SER测试，验证了一种将统计故障注入（SFI）到全系统硬件仿真模型中的任意锁存器中的方法。正如在IBM POWER6微处理器上执行的那样，SFI能够区分与注入位翻转相关的错误处理状态。提出了执行随机和有针对性的故障注入的方法。
A method for statistical fault injection (SFI) into arbitrary latches within a full system hardware-emulated model is validated against particle-beam-accelerated SER testing for a modern microprocessor. As performed on the IBM POWER6 microprocessor, SFI is capable of distinguishing between error handling states associated with the injected bit flip. Methodologies to perform random and targeted fault injection are presented.