Preparation of highly uniform self‐standing submicrometer polyimide films and an investigation of their antibulging capabilities
Preparation of highly uniform self‐standing submicrometer polyimide films and an investigation of their antibulging capabilities
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DOI：
10.1002/app.39977
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发表时间：
2014-03
影响因子：
3
通讯作者：
Q. Sun;Tianxiang Chen;Wei Hu;Yong Chen;Shengli Qi;Dezhen Wu;R. Jin
中科院分区：
文献类型：
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作者：
Q. Sun;Tianxiang Chen;Wei Hu;Yong Chen;Shengli Qi;Dezhen Wu;R. Jin
针对X射线天文应用，以3，3‘，4，4’-联苯基四甲酸二酸酐衍生的聚酰亚胺(Φ)和对苯二胺为原料，采用旋涂法制备了厚度均匀的大面积亚微米聚酰亚胺(PI)薄膜。研究了纺丝速度、PAA溶液表观粘度(η)和纺丝时间对聚酰亚胺(PI)薄膜厚度及其均匀性的影响。通过优化旋涂条件，我们制备了平均厚度在200-850 nm范围内的亚微米聚酰亚胺薄膜，薄膜厚度波动小于1.3%。压胀测试结果表明，在厚度为805 nm、内径为2.64 cm的测试条件下，制备的聚酰亚胺薄膜的最终爆破压力为20.2kPa.这表明聚酰亚胺薄膜具有良好的力学性能.本研究为制备厚度均匀的自支撑亚微米聚酰亚胺薄膜提供了一个典型的范例，并为X射线天文学应用开辟了道路。©2013威利期刊公司J.应用。波兰姆。科学，2014年，1311年，39977。
Aiming for X-ray astronomy applications, we prepared large-area submicrometer polyimide (PI) films [diameter (Φ) = 8 cm] with great thickness uniformity via the spin-coating technique by using a PI precursor, poly(amic acid) (PAA) derived from 3,3′,4,4′-biphenyltetracarboxylic dianhydride, and p-phenylenediamine as the starting materials. The effects of the spinning speed, apparent viscosity of the PAA solution (η), and spinning time on the PI film thickness and its uniformity, as characterized by the measurement of the film thickness every 0.5 cm along the diameter direction, were investigated. By optimizing the spin-coating conditions, we prepared final submicrometer PI films with average thicknesses in the range of 200–850 nm and with film thickness fluctuations of less than 1.3%. The pressure bulge test results indicate that at a thickness of 805 nm and an inside test aperture diameter of 2.64 cm, the prepared PI films reached a final burst pressure of 20.2 KPa; this suggested excellent mechanical performances in the self-standing submicrometer PI film. This study makes a contribution by providing a typical example and opening the way for the preparation of robust self-standing submicrometer PI films with great thickness uniformities for X-ray astronomy applications. © 2013 Wiley Periodicals, Inc. J. Appl. Polym. Sci., 2014, 131, 39977.