Development of Near-Field Fluorescence Lifetime Thermometry
Development of Near-Field Fluorescence Lifetime Thermometry
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DOI：
10.1080/15567260902820821
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发表时间：
2009-01-01
影响因子：
4.1
通讯作者：
Ngasaka, Yuji
中科院分区：
文献类型：
--
作者：
Taguchi, Yoshihiro;Oka, Takumi;Ngasaka, Yuji
精确的纳米尺度温度分布对于器件的热系统设计至关重要。然而，由于光的衍射极限，传统的光学温度计无法实现纳米级的空间分辨率。提出了一种基于近场荧光寿命的超分辨光学测温新技术。研制了基于频域荧光寿命测量方法的实验装置。将荧光团分子吸附在样品表面作为纳米温度探针，观察了荧光寿命的温度依赖性。对一种微细丝加热器的温度梯度测量结果表明了该方法的可行性。
Accurate temperature mapping in nanoscale is essential for the thermal system design of devices. However, conventional optical thermometers cannot achieve nanoscale spatial resolution because of the diffraction limit of light. A novel superresolved optical temperature measurement technique using the near-field fluorescence lifetime is presented. The experimental apparatus based on a frequency domain fluorescence lifetime measurement method has been developed. The fluorophore was molecularly adsorbed onto the sample surface as the nanoscale temperature probe, and the temperature dependence of the fluorescence lifetime was observed. The measurement results of the temperature gradient in a micro wire heater indicate the feasibility of the proposed method.