Carbon 1s X-ray photoemission line shape analysis of highly oriented pyrolytic graphite: the influence of structural damage on peak asymmetry.
Carbon 1s X-ray photoemission line shape analysis of highly oriented pyrolytic graphite: the influence of structural damage on peak asymmetry.
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DOI：
10.1021/la052922r
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发表时间：
2006-01
期刊：
影响因子：
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通讯作者：
De-quan Yang;E. Sacher
中科院分区：
文献类型：
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作者：
De-quan Yang;E. Sacher
通过比较两种XPS峰拟合方法，系统地研究了各种高取向热解石墨（HOPG）表面未经处理以及经keV Ar ~+束轰击和低能O_2、N_2、Ar和H_2O等离子体处理后的C_（1 s）XPS谱。这些程序将光谱视为（1）几个对称组分峰的重叠或（2）单个不对称峰。结果表明，在HOPG的情况下，定义的单峰的不对称参数直接相关的损伤程度的交替烃结构的HOPG表面，表现为它的相关性与对称峰分量由于受损的HOPG结构。
C 1s XPS spectra of various highly oriented pyrolytic graphite (HOPG) surfaces, untreated, as well as those treated by keV Ar+ beam bombardment and low-energy O2, N2, Ar, and H2O plasmas, have been systematically studied by comparing two XPS peak-fitting procedures. These procedures treat the spectrum as either (1) the overlap of several symmetric component peaks or (2) a single asymmetric peak. The results indicate that, in the case of HOPG, the asymmetry parameter defining the single peak is directly related to the extent of damage to the alternant hydrocarbon structure of the HOPG surface, as manifested by its correlation with the symmetric peak component due to the damaged HOPG structure.