Accurate and Simplified Consideration of the Probe Geometrical Defaults in Scanning Electrochemical Microscopy: Theoretical and Experimental Investigations
Accurate and Simplified Consideration of the Probe Geometrical Defaults in Scanning Electrochemical Microscopy: Theoretical and Experimental Investigations
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DOI：
10.1021/ac2026018
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发表时间：
2011-12-15
影响因子：
7.4
通讯作者：
Lefrou, Christine
中科院分区：
文献类型：
--
作者：
Cornut, Renaud;Bhasin, Amit;Lefrou, Christine
扫描电化学显微镜 (SECM) 尖端的制造并不总能保证完美的磁盘几何形状。在目前的工作中，从理论上和实验上研究了这些默认值的影响。通过考虑探针的行为类似于具有有效几何参数的微盘，确定可以准确考虑这些默认值的情况。在这些情况下，实验结果的定量分析被大大简化。该研究还提出了评估探针图片中表观微盘参数的表达式。
Fabrication of scanning electrochemical microscopy (SECM) tips cannot always guarantee a perfect disk geometry. In the present work, the impact of these defaults is investigated both theoretically and experimentally. The situations where these defaults can accurately be taken into account by considering that the probe behaves like a microdisk with effective geometric parameters are determined. In these situations, the quantitative analysis of the experimental results is greatly simplified. The study also proposes expressions to evaluate the apparent microdisk parameters from a picture of the probe.