Realizing the heteromorphic superlattice: Repeated heterolayers of amorphous insulator and polycrystalline semiconductor with minimal interface defects
Realizing the heteromorphic superlattice: Repeated heterolayers of amorphous insulator and polycrystalline semiconductor with minimal interface defects
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实现异形超晶格:具有最小界面缺陷的非晶绝缘体和多晶半导体的重复异质层
DOI:
10.1002/adma.202207927
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发表时间:
2023
影响因子:
29.4
通讯作者:
Medvedeva, Julia
中科院分区:
文献类型:
--
作者:
Lee, Woongkyu;Chen, Xianyu;Shao, Qing;Baik, Sung‐Il;Kim, Sungkyu;Seidman, David;Bedzyk, Michael;Dravid, Vinayak;Ketterson, John B.;Medvedeva, Julia
An unconventional “heteromorphic” superlattice (HSL) is realized, comprised of repeated layers of different materials with differing morphologies: semiconductingpc‐In2O3layers interleaved with insulatinga‐MoO3layers. Originally proposed by Tsu in 1989, yet never fully realized, the high quality of the HSL heterostructure demonstrated here validates the intuition of Tsu, whereby the flexibility of the bond angle in the amorphous phase and the passivation effect of the oxide at interfacial bonds serve to create smooth, high‐mobility interfaces. The alternating amorphous layers prevent strain accumulation in the polycrystalline layers while suppressing defect propagation across the HSL. For the HSL with 7:7 nm layer thickness, the observed electron mobility of 71 cm2Vs‐1, matches that of the highest quality In2O3thin films. The atomic structure and electronic properties of crystalline In2O3/amorphous MoO3interfaces are verified using ab‐initio molecular dynamics simulations and hybrid functional calculations. This work generalizes the superlattice concept to an entirely new paradigm of morphological combinations.