Sub-20-fs time-resolved measurements in an apertured near-field optical microscope combined with a pulse-shaping technique
Sub-20-fs time-resolved measurements in an apertured near-field optical microscope combined with a pulse-shaping technique
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结合脉冲整形技术在带孔近场光学显微镜中进行亚 20 飞秒时间分辨测量
DOI：
10.1143/apex.5.062002
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发表时间：
2012
期刊：
影响因子：
--
通讯作者：
Hiromi Okamoto
中科院分区：
文献类型：
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作者：
Hui Jun Wu;Yoshio Nishiyama;Tetsuya Narushima;Kohei Imura;Hiromi Okamoto
我们构建了一个超快近场光学显微镜系统，其近场泵浦/探针脉冲在探针尖端持续时间为17 fs。由无源和自适应群速度色散补偿器组成的脉冲整形系统消除了由光学元件，特别是光纤引起的色散效应。利用该装置，我们成功地测量了单个金纳米结构的脱相，时间常数约为10 fs。
We have constructed an ultrafast near-field optical microscope system with near-field pump/probe pulses with a 17 fs duration at the probe tip. The dispersion effects arising from the optical components, especially from the optical fiber, were removed by a pulse-shaping system that consists of passive and adaptive group-velocity dispersion compensators. With this apparatus, we succeeded in measuring dephasing in a single gold nanostructure with a time constant on the order of 10 fs.