Flux Pinning by Columnar Defects Along a-axis in a-axis Oriented YBCO Thin Films
Flux Pinning by Columnar Defects Along a-axis in a-axis Oriented YBCO Thin Films
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a 轴取向 YBCO 薄膜中沿 a 轴的柱状缺陷引起的通量钉扎
DOI：
10.1109/tasc.2019.2896473
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发表时间：
2019
影响因子：
1.8
通讯作者：
Ishikawa Norito
中科院分区：
文献类型：
--
作者：
Sueyoshi Tetsuro;Iwanaga Yasuya;Fujiyoshi Takanori;Takai Yosuke;Muta Mitsuhiro;Mukaida Masashi;Ichinose Ataru;Ishikawa Norito
采用重离子辐照法在面内取向的a轴取向YBa 2Cu 3 Oy薄膜中引入沿着a轴方向的柱状缺陷（CD），研究CD对B附近磁通钉扎特性的影响||AB.临界电流密度Jcat B|| c在照射后显着降低，因为CD充当了通量沿着其长度蔓延的通道。Jcat B的磁场依赖性||另一方面，由于CD的引入，AB被削弱了。这意味着CD可以在B处捕获通量线||ab，而自然生长缺陷作为有效的ab相关的PC存在。CD沿着a轴的捕获角与CD沿着c轴的捕获角相比非常窄（~5.8°），并且与其他ab相关PC大致一致。CD沿a轴方向沿着的小俘获角是由于绕B的椭圆芯磁通线具有较强的线张力能||AB.
Columnar defects (CDs) along a-axis were installed into an in-plane aligned a-axis-oriented YBa2Cu3Oyfilm by using heavy-ion irradiation, in order to clarify the influence of CDs on flux pinning properties around B || ab. The critical current density Jcat B || c significantly decreases after the irradiation, since the CDs act as a channel for flux creep along their length. The magnetic field dependence of Jcat B || ab, on the other hand, is weakened by the introduction of CDs. This means that the CDs can trap flux lines at B || ab, whereas naturally growth defects working as effective ab-correlated PCs exist. The trapping angle of CDs along the a-axis is extremely narrow (~5.8°) in comparison with CDs along the c-axis and is roughly coincides with other ab-correlated PCs. The small trapping angle of CDs along the a-axis is attributed to strong line tension energy of flux lines with elliptical core around B || ab.