On the mechanism of irradiation-enhanced exchange bias
On the mechanism of irradiation-enhanced exchange bias
复制标题
辐照增强交换偏压的机理研究
DOI：
10.1209/epl/i2003-10223-y
复制
发表时间：
2003
期刊：
影响因子：
1.8
通讯作者：
B. Hillebrands
中科院分区：
文献类型：
--
作者：
S. Poppe;J. Fassbender;B. Hillebrands
采用层析离子辐照的方法，研究了NiFe/FeMn双层膜中交换偏置效应的辐照修正机制。结果表明，在辐照过程中，不仅缺陷的位置是至关重要的，而且两层之间的磁耦合也至关重要。这需要扩展目前考虑到交易所偏置系统缺陷的模型。
By means of layer-resolved ion irradiation, the mechanisms involved in the irradiation-driven modifications of the exchange bias effect in NiFe/FeMn bilayers have been investigated. It is shown that not only the locations of the defects but also the magnetic coupling between both layers during the irradiation process is of crucial importance. This requires an extension of current models accounting for defects in exchange bias systems.