Structural Degradation of Cu Current Collector During Electrochemical Cycling of Sn-Based Lithium-Ion Batteries
Structural Degradation of Cu Current Collector During Electrochemical Cycling of Sn-Based Lithium-Ion Batteries
复制标题
锡基锂离子电池电化学循环过程中铜集流体的结构退化
DOI:
10.1007/s11664-019-07549-0
复制
发表时间:
2019-09
影响因子:
2.1
通讯作者:
Yang Fuqian
中科院分区:
文献类型:
--
作者:
Guo Meiqing;Meng Weijia;Zhang Xiaogang;Bai Zhongchao;Wang Genwei;Wang Zhihua;Yang Fuqian
It is an open question whether there exists structural degradation of current collectors, which likely can lead to the capacity loss of lithium-ion batteries. In this work, we investigate the cycling-induced structural degradation/damage of the Cu current collector used in Sn-based lithium half cells. Electrochemical cycling causes the formation of a layer of porous structure even after the first cycle and the formation of Li2SnCu. The thickness of the porous structure increases with the increase of the cycle number, and local separation between the porous layer and the “solid” Cu layer occurs after prolonged cycling. The nominal contact moduli of the porous layers formed after one and five electrochemical cycles are slightly larger than the pristine Cu current collector. For the porous layers formed after twenty or more electrochemical cycles, the normal contact modulus is generally less than the pristine Cu. The indentation hardnesses of the porous structures are generally less than the pristine Cu except for the porous structure formed after five electrochemical cycles.
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DOI:
10.1115/1.1857920
发表时间:
2005-02-01
影响因子:
1.7
作者:
Shi, X;Polycarpou, AA
通讯作者:
Polycarpou, AA
影响因子:
2.1
作者:
Hyeji Park;Hyelim Choi;Kyungju Nam;Sukyung Lee;J. Um;Kyungbae Kim;Jae‐Hun Kim;W. Yoon;H. Choe
通讯作者:
Hyeji Park;Hyelim Choi;Kyungju Nam;Sukyung Lee;J. Um;Kyungbae Kim;Jae‐Hun Kim;W. Yoon;H. Choe
影响因子:
3.9
作者:
D. Aurbach;Y. Cohen
通讯作者:
D. Aurbach;Y. Cohen
影响因子:
2.1
作者:
Guodong Liang;Xiaogang Sun;Jia‐mei Lai;Chengcheng Wei;Yapan Huang;Hao Hu;Jingyi Zou;Yuhao Xu
通讯作者:
Guodong Liang;Xiaogang Sun;Jia‐mei Lai;Chengcheng Wei;Yapan Huang;Hao Hu;Jingyi Zou;Yuhao Xu
影响因子:
3.9
作者:
J. Um;Hyeji Park;Yong‐Hun Cho;Matthew P. B. Glazer;D. Dunand;H. Choe;Y. Sung
通讯作者:
J. Um;Hyeji Park;Yong‐Hun Cho;Matthew P. B. Glazer;D. Dunand;H. Choe;Y. Sung