Selection of modulation frequency of FT-IR equipped with an MCT detector for thin-film analysis
Selection of modulation frequency of FT-IR equipped with an MCT detector for thin-film analysis
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DOI：
10.1016/j.vibspec.2008.10.018
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发表时间：
2009-09-18
影响因子：
2.5
通讯作者：
Sato, Yoshiko
中科院分区：
文献类型：
--
作者：
Hasegawa, Takeshi;Taniguchi, Katsuhiko;Sato, Yoshiko
为了获得单层水平薄膜的高质量光谱，对配备碲镉汞（MCT）探测器的傅里叶变换红外光谱仪（FT - IR）的最佳调制频率（扫描速率）进行了研究。由于MCT探测器是一种半导体光器件，与热释电探测器相比，它对调制频率的响应不明显。然而，极薄的薄膜需要高通量测量以获得高信噪比。在本研究中，通过使用具有不同采样频率的两台光谱仪改变调制频率，对通量和测量时间的平衡进行了研究。在本研究中，还根据调制频率对吸光度光谱基线的稳定性进行了研究，结果表明60 kHz最适合用于朗缪尔 - 布洛杰特（Langmuir - Blodgett）薄膜的定量可靠透射测量。（C）2008爱思唯尔有限公司。保留所有权利。
Optimal modulation frequency (scan rate) of an FT-IR equipped with a mercury-cadmium-telluride (MCT) detector has been investigated for obtaining high quality spectra of a monolayer-level thin film. Since an MCT detector is a semiconductor light device, it does not respond to modulation frequency significantly in comparison to a pyroelectric detector. A very thin him, however, requires high-throughput measurements to have high signal-to-noise ratio. In this Study, a balance of throughput and measurement time has been investigated by varying modulation frequency by using two spectrometers that have different sampling frequencies. In this Study, the stability of the baseline of absorbance spectra was also investigated depending oil modulation frequencies, which suggested that 60 kHz was most Suitable for quantitatively reliable transmission measurements of Langmuir-Blodgett films. (C) 2008 Elsevier B.V. All rights reserved.